| |||
| 测试访问端口 (A collection of boundary scan control signals that define a serial protocol for scan-based devices. There are five pins, TCK/clock, TMS/mode select, TDI/data in, TDO/data out, and TRST/reset) | |||
| Angielski tezaurus | |||
| |||
| TAP (IC, IEEE 1149.1) | |||
| |||
| 测试访问端口 (A collection of boundary scan control signals that define a serial protocol for scan-based devices. There are five pins, TCK/clock, TMS/mode select, TDI/data in, TDO/data out, and TRST/reset) | |||
| Angielski tezaurus | |||
| |||
| TAP (IC, IEEE 1149.1) | |||
